ISSN 1991-2927
 

ACP № 2 (56) 2019

Automation of Measurement Processes of Semiconductor Devices Electrical Characteristics With the Use of Psoc

Ilia Vladimirovich Frolov, Ulyanovsk Branch of the Kotel’nikov Institute of Radio-Engineering and Electronics of the Russian Academy of Sciences, andidate of Engineering; graduated from the Faculty of Radioengineering of Ulyanovsk State Technical University; Senior Scientist at the Ulyanovsk Branch of the Kotel’nikov Institute of Radio-Engineering and Electronics of the Russian Academy of Sciences; an author of papers in the field of methods and means of nondestructive inspection for semiconductor devices. [e-mail: This email address is being protected from spambots. You need JavaScript enabled to view it. ]I. Frolov,

Oleg Aleksandrovich Radaev, Ulyanovsk Branch of the Kotel’nikov Institute of Radio-Engineering and Electronics of the Russian Academy of Sciences, graduated from the Faculty of Radioengineering of Ulyanovsk State Technical University; Senior Scientist at the Ulyanovsk Branch of the Kotel’nikov Institute of Radio-Engineering and Electronics of the Russian Academy of Sciences; Postgraduate Student at Ulyanovsk State Technical University; an author of papers in the field of development of semiconductor devices automated measurement tools. [e-mail: This email address is being protected from spambots. You need JavaScript enabled to view it. ]O. Radaev,

Viacheslav Andreevich Sergeev, Ulyanovsk Branch of the Kotel’nikov Institute of Radio-Engineering and Electronics of the Russian Academy of Sciences, Doctor of Engineering, Associate Professor; graduated from the Faculty of Physics of Gorky State Technical University; Director of the Ulyanovsk Branch of the Kotel’nikov Institute of Radio-Engineering and Electronics of the Russian Academy of Sciences; an author of papers in the field of the modeling and researching semiconductor devices and integrated circuits parameters. [e-mail: This email address is being protected from spambots. You need JavaScript enabled to view it. ]V. Sergeev

Automation of Measurement Processes of Semiconductor Devices Electrical Characteristics With the Use of Psoc 000_13.pdf

The possibilities and features of automation of measurement processes of the semiconductor devices electrical characteristics with the use of a programmable system-on-chip psoc 4 produced by cypress are considered. The authors discuss the general requirements to the hardware of modern measurers of semiconductor devices characteristics. The block diagram of the automated measurer of capacitance-voltage characteristics of semiconductor diodes implementing the frequency method of capacitance measurement is presented. The measuring block performs the functions of data exchange with the computer, setting block for the mode of the controlled object, measuring oscillation frequency of Lc oscillator and measurement information processing. The block is implemented on a programmable system-on-chip psoc 4 produced by cypress.

Measurement automation, semiconductor device, capacitance-voltage characteristics, programmable system-on chip.

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