ISSN 1991-2927
 

ACP № 2 (56) 2019

Author: "Sergei Evgenevich Rezchikov "

Viacheslav Andreevich Sergeev, Ulyanovsk Branch of the Kotel’nikov Institute of Radioengineering and Electronics of the Russian Academy of sciences, Doctor of Engineering, Associate Professor; graduated from the Faculty of Physics of Gorky State Technical University; Head of Ulyanovsk Branch of the Kotel’nikov Institute of Radioengineering and Electronics (IRE) of the Russian Academy of sciences (RAS); Head of the Department of Radioengineering, Opto and Nanolectronics of Ulyanovsk State Technical University at Ulyanovsk Branch of the Kotel’nikov IRE; an author of monographs, articles, and inventions in the field of researching and simulating semiconductor device and integrated circuit performance, and measuring their thermal characteristics. [e-mail: sva@ulstu.ru]V. Sergeev,

Sergei Evgenevich Rezchikov, Ulyanovsk Branch of the Kotel’nikov Institute of Radioengineering and Electronics of the Russian Academy of sciences, graduated from the Faculty of Radioengineering of Ulyanovsk State Technical University; Postgraduate Student of the Base Department of Radioengineering, Opto and Nanolectronics at the Kotel’nikov Institute of Radioengineering and Electronics (IRE) of RAS; an author of articles in the field of measurement automation and noise characteristics research of semiconductor devices and integrated circuits. [e-mail: s.rezchikov@ulstu.ru]S. Rezchikov

The Optimization of Procedures for Measuring the Semiconducter Devices’ Paramters of Low-freqency Noise Influenced By White Noise 52_8.pdf

The brief analysis of techniques for measuring the parameters of low-frequency (LF) noise with 1/f?-type spectrum has been proposed. The estimation of measurement error of power spectral density (PSD) and ?-rays spectrum index are given by taking into account the influence of white-noise level. Based on the results of noise spectral power density measurements implemented at three frequencies when series and parallel filtering, authors propose procedures of measuring the index of ?-rays spectrum that minimize a total inaccuracy of ? value determination. The essence of optimization in case of serial filtering reduces to the optimum distribution of preset overall measurement time between measurements at the first, second and additional frequencies in case of the given frequency ratio, and when parallel filtering, to the determination of the optimum frequency ratio of measuring the noise PSD in case of the preset overall measurement time. A systematic measurement error of ? value has been estimated while implementing of various measurement procedures depending on ? value. The estimations are presented in the article. It is shown that the optimization of measuring procedures allows to reduce an error of the ? value determination by 1.5 to 2 times.

Low-frequency noise, power spectral density, index of spectrum form, measurement, error, optimum procedures.

2018_ 2

Sections: Mathematical modeling

Subjects: Mathematical modeling.


Viacheslav Andreevich Sergeev, Ulyanovsk Branch of the Kotel’nikov IRE of RAS, Doctor of Engineering, Associate Professor; graduated from the Faculty of Physics of Gorky State Technical University; Head of Ulyanovsk Branch of the Kotel’nikov Institute of Radioengineering and Electronics (IRE) of the Russian Academy of Sciences (RAS); Head of the Department of Radioengineering, Opto and Nanolectronics of Ulyanovsk State Technical University at Ulyanovsk Branch of the Kotel’nikov IRE of RAS; an author of monographs, articles, and inventions in the field of researching and simulating semiconductor devices and integrated circuits performance, and measuring their thermal characteristics. [e-mail: sva@ulstu.ru]V. Sergeev,

Sergei Evgenevich Rezchikov , Ulyanovsk State Technical University, graduated from the Faculty of Radioengineering of Ulyanovsk State Technical University; Postgraduate Student at the Department of Radioengineering, Opto and Nanolectronics of Ulyanovsk State Technical University at Ulyanovsk Branch of the Kotel’nikov IRE of RAS; an author of papers in the field of measurement automation and researching noise characteristics of semiconductor devices and integrated circuits. [e-mail: s.rezchikov@ulstu.ru]S. Rezchikov

Optimization of the Procedures of Measuring the Parameters of Low-frequence Noise With 1/f Γ-type Spectrum 000_13.pdf

The short analysis of measurement methods for parameters of low-frequency (LF) noise with 1/fγ-type is considered. The authors show that the total measurement error of the LF-noise power spectral density (PSD) at the specified time of averaging is minimum at a certain (optimum) bandwidth of the filter. Measurement procedures for an exponent γ of PSD frequency dependence minimizing a total measurement error γ by results of measurement of PSD noise at two frequencies at series and parallel filtration are offered. The optimization essence at a series filtration comes down to optimum distribution of the specified total time of measurement at the specified relation of frequencies between measurements at the first and second frequency, and at a parallel filtration -to definition of the optimum relation of frequencies for PSD noise measurement at the specified total time of measurement. Methodical measurement error estimates for γare given at implementation of various measurement procedures depending on the γvalue.

Low-frequency noise, power spectral density, parameters, measurement, error, optimum procedures.

2016_ 4

Sections: Electrical engineering and electronics

Subjects: Electrical engineering and electronics.


© FRPC JSC 'RPA 'Mars', 2009-2018 The web-site runs on Joomla!