ISSN 1991-2927
 

ACP № 4 (58) 2019

Author: "Oksana Vadimovna Maksimova"

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УДК 681.883.7

Oksana Vadimovna Maksimova, Candidate of Sciences in Engineering, Associate Professor; graduated from Ulyanovsk State Technical University; Head of the Department of Aviation Equipment of the Bugaev Ulyanovsk State Institute of Civil Aviation; an author of articles, monographs, and inventions in the field of optoelectronics and microwave engineering. e-mail: first32007@yandex.ruO.V. Maksimova,

Petr Valerevich Nikolaev, Postgraduate Student at the Department of Design and Technology of Electronic Devices of Ulyanovsk State Technical University; graduated from the Radioengineering Faculty of UlSTU; an author of articles, inventions in the field of optoelectronics and computer engineering. e-mail: nikollaew@mail.ruP.V. Nikolaev,

Mikhail Konstantinovich Samokhvalov, Doctor of Sciences in Physics and Mathematics, Professor at Ulyanovsk State Technical University; graduated from the Faculty of Physics of Chernyshevsky Saratov State University; an author of articles, monographs in the field of optoelectronics. e-mail: sam@ulstu.ruM.K. Samokhvalov

Methods and means for automated monitoring of thin film indicators58_12.pdf

The article deals with the algorithms, methods for measuring the structure parameters of thin-film electroluminescent indicators. An algorithm for determining threshold voltage and plotting current-brightness characteristics was created. The realization of this algorithm accelerates the parameters monitoring process when producing the known display equipment items and developing the new one based on thin-film electroluminescent indicators. The main aspects for a comprehensive approach to solve problems of measuring process automation of parameter values of thin-film electroluminescent indicator structures were identified. The features of the thin-film electroluminescent indicator performance were considered as a basis for building the structure of automated testers. The automation of experimental results processing at the software level was described. The key parameters of indicators were determined, automation problems of measuring processes were denoted. The algorithm for determining threshold voltage and plotting current-brightness characteristics of thin-film electroluminescent indicators in an automated mode was developed. The ideas explained in this article allow formulating the requirement specification on developing a device for automated measuring the thin-film electroluminescent element parameters as well as its components and software.

Thin-film indicator, brightness, automation, measurements, electroluminescence, thin films, algorithm.

2019_ 4

Sections: Electrical engineering and electronics

Subjects: Electrical engineering and electronics.

Oksana Vadimovna Maksimova, Ulyanovsk State Technical University, Associate Professor at the Department of Electronic Instrumentation Design and Technology of Ulyanovsk State Technical University; an author of articles and monographs in the field of optoelectronic and microwave engineering. [e-mail: first32007@yandex.ru]O. Maksimova,

Sergei Vladimirovich Moiseenko, Peoples’ Friendship University, graduated from Peoples’ Friendship University of Russia; a post-graduate student at the Department of Cybernetics and Mechatronics of Peoples’ Friendship University of Russia; an author of articles in the field of liquid-crystal characteristics measurement . [e-mail: cormorant.xiii@gmail.com]S. Moiseenko,

Sergei Mikhailovich Maksimov, Ulyanovsk State Technical University, graduated from Ulyanovsk State Technical University with the specialty in Design and Technology of Electronic Instrumentation; a post-graduate student at the Department of Design and Technology of Electronic Instrumentation of Ulyanovsk State Technical University; an author of articles in the field of optoelectronics. [e-mail: maximovsm@yandex.ru]S. Maksimov

Measurement Process of Automation of Nanostructured Indicators Lightning Characteristics 39_14.pdf

It is now impossible to imagine an electronic device without the ergonomic display. For the development of modern and advanced display products need to constantly explore new materials and construction of indicators, as well as their parameters. The study of such structures is a complex task and requires significant research and development work. Therefore, the development of automated methods for measuring the parameters of the displays is an important task as it allows to accelerate the search for new materials and structures with the optimal settings. Employees of Ulyanovsk State Technical University together with scientists from the Russian Peoples' Friendship University were investigated methods of measuring devices basic parameters of liquid crystal structures and thin-film electroluminescent emitters. The joint work began forming ideas of conceptual approaches to the development of automated systems for measuring parameters of nanostructured lighting indicator elements.

Thin-film indicator, brightness, luminous efficiency, liquid crystals, automation, formalization, measurements, electroluminescence.

2015_ 1

Sections: Computer-aided engineering

Subjects: Computer-aided engineering.


Sergei Mikhailovich Maksimov, Ulyanovsk State Technical University, graduated from the Ulyanovsk State Technical University (UlSTU) with the specialty of Design and Technology of Electronic Instrumentation; a post-graduate student of the ‘Design and Technology of Electronic Instrumentation’ Department at UlSTU; an author of articles in the field of optoelectronics. [e-mail: maximovsm@yandex.ru]S. Maksimov,

Oksana Vadimovna Maksimova, Ulyanovsk State Technical University, Candidate of Engineering, Associate Professor at the Department of Electronic Instrumentation Design and Technology of Ulyanovsk State Technical University; an author of articles and monographs in the field of optoelectronic and microwave engineering. [e-mail: first32007@yandex.ru]O. Maksimova,

Mikhail Konstantinovich Samokhvalov, Ulyanovsk State Technical University, Doctor of Physics and Mathematics, Professor; head of the Department of Electronic Instrumentation Design and Technology at Ulyanovsk State Technical University; an author of articles and monographs in the field of optoelectronics. [e-mail: sam@ulstu.ru]M. Samokhvalov

Tasks of Modeling Automation of Brightness and Luminous Efficiency of Thin-film Electroluminscent Condensators 36_14.pdf

The modern means of information representation intended for professional use must meet certain requirements which depend on their field of application and maintenance conditions. The selection of constructive decisions is made according to the visualization system requirements. Certain of the computer-aided design (CAD) system simplifies the procedure of the design choice with necessary characteristics. The presented of investigations and calculations of the lighting characteristics of thin-film electroluminescent indicators. The main characteristics of indicator devices are explained by means impact excitation activator centers with the following light relaxation. These equations have been adapted for the development of CAD system of thin-film electroluminescent indicators. The presented of conspicuous lighting parameters dependence on the structural factors. Physical processes determined the thin-film light emitters work are sufficiently studied, that permits elaboration and production of different indicators and displays.

Thin film electroluminescence indicator, brightness, luminous efficiency, phosphor, activator centers, electroluminescence.

2014_ 2

Sections: Computer-aided engineering

Subjects: Computer-aided engineering.


Denis Aleksandrovich Evsevichev, Ulyanovsk State Technical University, Post-graduate Student at Ulyanovsk State Technical University; graduated from Ulyanovsk State Technical University with the speciality in Electronic Instrumentation Design and Technology; an author of articles in the field of optoelectronic and circuitry engineering; has certificate of registration of software in the same field of research. [e-mail: denistk_87@mail.ru]D. Evsevichev,

Oksana Vadimovna Maksimova, Ulyanovsk State Technical University, Candidate of Engineering, graduated from Ulyanovsk State Technical University with the speciality in Electronic Instrumentation Design and Technology; Associate Professor at the Department of Electronic Instrumentation Design and Technology of Ulyanovsk State Technical University; an author of articles and monographs in the field of optoelectronic and microwave engineering. [e-mail: first32007@yandex.ru]O. Maksimova,

Mikhail Konstantinovich Samokhvalov, Ulyanovsk State Technical University, Doctor of Physics and Mathematics, Professor; graduated from Saratov State University with the speciality in Semiconductors and Dielectrics; a head of the Department of Electronic Instrumentation Design and Technology at Ulyanovsk State Technical University; an author of articles and monographs in the field of optoelectronics. [e-mail: sam@ulstu.ru]M. Samokhvalov

A Solution of Computer-aided Design of the Thin-film Electroluminescent Indicators 33_10.pdf

A development and a solution of designing problems of the advanced thin-film electroluminescent (TFEL) display devices is an important undertaking in the engineering field. The development and optimization of the TFEL display design is a complex task and requires a considerable work of the engineer. The solution of this problem can be accomplished by the use of automation means. Therefore, the development of the TFEL indicator design algorithm and calculation program is essential.

Thin films, electroluminescence, display, design.

2013_ 3

Sections: Computer-aided design system

Subjects: Computer-aided engineering, Electrical engineering and electronics.


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