ISSN 1991-2927
 

ACP № 1 (59) 2020

Author: "Sergei Mikhailovich Maksimov"

Oksana Vadimovna Maksimova, Ulyanovsk State Technical University, Associate Professor at the Department of Electronic Instrumentation Design and Technology of Ulyanovsk State Technical University; an author of articles and monographs in the field of optoelectronic and microwave engineering. [e-mail: first32007@yandex.ru]O. Maksimova,

Sergei Vladimirovich Moiseenko, Peoples’ Friendship University, graduated from Peoples’ Friendship University of Russia; a post-graduate student at the Department of Cybernetics and Mechatronics of Peoples’ Friendship University of Russia; an author of articles in the field of liquid-crystal characteristics measurement . [e-mail: cormorant.xiii@gmail.com]S. Moiseenko,

Sergei Mikhailovich Maksimov, Ulyanovsk State Technical University, graduated from Ulyanovsk State Technical University with the specialty in Design and Technology of Electronic Instrumentation; a post-graduate student at the Department of Design and Technology of Electronic Instrumentation of Ulyanovsk State Technical University; an author of articles in the field of optoelectronics. [e-mail: maximovsm@yandex.ru]S. Maksimov

Measurement Process of Automation of Nanostructured Indicators Lightning Characteristics 39_14.pdf

It is now impossible to imagine an electronic device without the ergonomic display. For the development of modern and advanced display products need to constantly explore new materials and construction of indicators, as well as their parameters. The study of such structures is a complex task and requires significant research and development work. Therefore, the development of automated methods for measuring the parameters of the displays is an important task as it allows to accelerate the search for new materials and structures with the optimal settings. Employees of Ulyanovsk State Technical University together with scientists from the Russian Peoples' Friendship University were investigated methods of measuring devices basic parameters of liquid crystal structures and thin-film electroluminescent emitters. The joint work began forming ideas of conceptual approaches to the development of automated systems for measuring parameters of nanostructured lighting indicator elements.

Thin-film indicator, brightness, luminous efficiency, liquid crystals, automation, formalization, measurements, electroluminescence.

2015_ 1

Sections: Computer-aided engineering

Subjects: Computer-aided engineering.


Sergei Mikhailovich Maksimov, Ulyanovsk State Technical University, graduated from the Ulyanovsk State Technical University (UlSTU) with the specialty of Design and Technology of Electronic Instrumentation; a post-graduate student of the ‘Design and Technology of Electronic Instrumentation’ Department at UlSTU; an author of articles in the field of optoelectronics. [e-mail: maximovsm@yandex.ru]S. Maksimov,

Oksana Vadimovna Maksimova, Ulyanovsk State Technical University, Candidate of Engineering, Associate Professor at the Department of Electronic Instrumentation Design and Technology of Ulyanovsk State Technical University; an author of articles and monographs in the field of optoelectronic and microwave engineering. [e-mail: first32007@yandex.ru]O. Maksimova,

Mikhail Konstantinovich Samokhvalov, Ulyanovsk State Technical University, Doctor of Physics and Mathematics, Professor; head of the Department of Electronic Instrumentation Design and Technology at Ulyanovsk State Technical University; an author of articles and monographs in the field of optoelectronics. [e-mail: sam@ulstu.ru]M. Samokhvalov

Tasks of Modeling Automation of Brightness and Luminous Efficiency of Thin-film Electroluminscent Condensators 36_14.pdf

The modern means of information representation intended for professional use must meet certain requirements which depend on their field of application and maintenance conditions. The selection of constructive decisions is made according to the visualization system requirements. Certain of the computer-aided design (CAD) system simplifies the procedure of the design choice with necessary characteristics. The presented of investigations and calculations of the lighting characteristics of thin-film electroluminescent indicators. The main characteristics of indicator devices are explained by means impact excitation activator centers with the following light relaxation. These equations have been adapted for the development of CAD system of thin-film electroluminescent indicators. The presented of conspicuous lighting parameters dependence on the structural factors. Physical processes determined the thin-film light emitters work are sufficiently studied, that permits elaboration and production of different indicators and displays.

Thin film electroluminescence indicator, brightness, luminous efficiency, phosphor, activator centers, electroluminescence.

2014_ 2

Sections: Computer-aided engineering

Subjects: Computer-aided engineering.


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